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DONGFANG JINGYUAN ELECTRON LTD

Overview
  • Total Patents
    48
  • GoodIP Patent Rank
    31,558
  • Filing trend
    ⇩ 68.0%
About

DONGFANG JINGYUAN ELECTRON LTD has a total of 48 patent applications. It decreased the IP activity by 68.0%. Its first patent ever was published in 2015. It filed its patents most often in China, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets computer technology, semiconductors and optics are TECHINSIGHTS INC, Carl Zeiss Microscopy Ltd and NGR INC.

Patent filings in countries

World map showing DONGFANG JINGYUAN ELECTRON LTDs patent filings in countries

Patent filings per year

Chart showing DONGFANG JINGYUAN ELECTRON LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Zhang Zhaoli 25
#2 Ma Weimin 16
#3 Lin Jie 15
#4 Yu Zongchang 12
#5 Sun Weiqiang 10
#6 Liu Hua-Yu 6
#7 Yu Zongqiang 5
#8 Zhao Yan 5
#9 Mu Yuhai 4
#10 Feng Tao 4

Latest patents

Publication Filing date Title
CN112114501A Method for calculating Langqi shearing interference image in photoetching projection objective
CN112015045A Mask optimization method and electronic equipment
CN110765724A Mask optimization method and electronic equipment
CN110426914A A kind of modification method and electronic equipment of Sub-resolution assist features
US2019088442A1 Electron-Beam Inspection Systems with optimized throughput
US2018254167A1 Patterned substrate imaging using multiple electron beams
CN109300760A Beam control apparatus and method, electron beam imaging module, Electron-beam measuring equipment
CN109298001A Electron beam imaging module, Electron-beam measuring equipment and its image-pickup method
CN108931883A A method of optimization mask layout
US2018218490A1 Care area generation for inspecting integrated circuits
US2018218493A1 Dynamic updates for the inspection of integrated circuits
US2018218096A1 Method and system for defect prediction of integrated circuits
US2018218090A1 Guided defect detection of integrated circuits
US2018218492A1 Method and system for identifying defects of integrated circuits
CN106844044A A kind of data processing method and device
CN106290396A Sample defects detection device
US2018018542A1 Augmented automatic defect classification
US2018060702A1 Learning based defect classification
US2018053291A1 Reference image contour generation
CN106291899A Lighting module, optical microscope system and Electron-beam measuring device