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FEI CO

Overview
  • Total Patents
    2,182
  • GoodIP Patent Rank
    1,670
  • Filing trend
    ⇧ 20.0%
About

FEI CO has a total of 2,182 patent applications. It increased the IP activity by 20.0%. Its first patent ever was published in 1991. It filed its patents most often in EPO (European Patent Office), United States and Japan. Its main competitors in its focus markets electrical machinery and energy, measurement and semiconductors are FOCUS EBEAM TECH BEIJING CO LTD, VESTAL MARVIN L and PHOTO ELECTRON SOUL INC.

Patent filings per year

Chart showing FEI COs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Buijsse Bart 79
#2 Stone Stacey 75
#3 Schmidt Michael 74
#4 Toth Milos 67
#5 Parker N William 65
#6 Henstra Alexander 63
#7 Dona Pleun 61
#8 Utlaut Mark W 60
#9 Blackwood Jeffrey 57
#10 Rue Chad 53

Latest patents

Publication Filing date Title
EP3809447A1 Method for large-area 3d analysis of samples using glancing incidence fib milling
KR20210018098A Coating on dielectric insert of a resonant rf cavity
US2020410697A1 Automated and robust method for recording nm-resolution 3d image data from serial ultra-sections of life-sciences samples with electron microscopes
CN112146967A System and method for preparing and delivering biological samples for charged particle analysis
KR20200145724A Perimeter trench formation and delineation etch delayering
US2020365366A1 Laser-based phase plate image contrast manipulation
EP3726206A1 Methods and systems for inclusion analysis
US2021035775A1 System and method for beam position visualization
US10923308B1 Method and system for energy resolved chroma imaging
US2020161083A1 Parameter estimation for metrology of features in an image
US2021125808A1 Particle beam profiles for analytic equipment configuration
US2021104375A1 Low kev ion beam image restoration by machine learning for object localization
EP3637453A1 Gis welded micromanipulator extensions
US2021090846A1 Pulsed cfe electron source with fast blanker for ultrafast tem applications
US2021088770A1 Pose estimation using sematic segmentation
EP3792952A1 Light guide assembly for an electron microscope
US10921268B1 Methods and devices for preparing sample for cryogenic electron microscopy
US2021066032A1 Multi modal cryo compatible guid grid
US2021049493A1 Systems and methods for quantum computing based sample analysis
EP3780065A1 Charged particle microscope with a pixelated detector, and method of detecting particulate radiation using a pixelated detector