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APPLIED MATERIALS ISRAEL LTD

Overview
  • Total Patents
    816
  • GoodIP Patent Rank
    4,057
  • Filing trend
    ⇧ 84.0%
About

APPLIED MATERIALS ISRAEL LTD has a total of 816 patent applications. It increased the IP activity by 84.0%. Its first patent ever was published in 1990. It filed its patents most often in United States, Republic of Korea and Taiwan. Its main competitors in its focus markets measurement, computer technology and electrical machinery and energy are TASMIT INC, NGR INC and TECHINSIGHTS INC.

Patent filings per year

Chart showing APPLIED MATERIALS ISRAEL LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Schwarzband Ishai 62
#2 Feldman Haim 60
#3 Naftali Ron 50
#4 Cohen Boaz 48
#5 Shemesh Dror 44
#6 Uziel Yoram 42
#7 Kaizerman Idan 39
#8 Litman Alon 38
#9 Asbag Assaf 33
#10 Kris Roman 32

Latest patents

Publication Filing date Title
US2020400589A1 Multi-perspective wafer analysis
US2021066026A1 Evaluating an intermediate product related to a three-dimensional nand memory unit
US2021073963A1 Mask inspection of a semiconductor specimen
WO2020234863A1 Machine learning-based classification of defects in a semiconductor specimen
WO2020176270A1 System and method for detecting rare stochastic defects
US10903044B1 Filling empty structures with deposition under high-energy SEM for uniform DE layering
US2020232934A1 Multi-perspective wafer analysis
CN111444934A Method and system for classifying defects in semiconductor sample
WO2020146129A1 Scanning electron microscope and a method for overlay monitoring
KR20200073145A Process monitoring
US10922217B1 Adaptive regression testing
WO2020089910A1 Method, system and computer program product for 3d-nand cdsem metrology
US2021116368A1 Optical inspection
WO2021078352A1 Method for inspecting a specimen and charged particle beam device
US2021098315A1 Method for curing solid state photosensors
US2020013603A1 Cleanliness monitor and a method for monitoring a cleanliness of a vacuum chamber
US2021082664A1 Forming a vertical surface
US2021063461A1 Detection of an electric arc hazard related to a wafer
US2021042905A1 Detecting targeted locations in a semiconductor specimen
US2021036142A1 Generating milled structural elements with a flat upper surface