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NGR INC

Overview
  • Total Patents
    52
  • GoodIP Patent Rank
    32,335
  • Filing trend
    ⇩ 6.0%
About

NGR INC has a total of 52 patent applications. It decreased the IP activity by 6.0%. Its first patent ever was published in 2007. It filed its patents most often in Japan, United States and Taiwan. Its main competitors in its focus markets computer technology, electrical machinery and energy and measurement are DONGFANG JINGYUAN ELECTRON LTD, APPLIED MATERIALS ISRAEL LTD and NORAN INSTR INC.

Patent filings in countries

World map showing NGR INCs patent filings in countries

Patent filings per year

Chart showing NGR INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Sato Yoshishige 9
#2 Kato Makoto 7
#3 Sasaki Sumio 7
#4 Yamazaki Yuichiro 7
#5 Kubota Kazufumi 6
#6 Kaneko Koji 6
#7 Kitamura Tadashi 6
#8 Oya Masahiro 5
#9 Tanaka Yukihiro 5
#10 Tanaka Kazuto 4

Latest patents

Publication Filing date Title
JP2019178869A Method and apparatus for generating correction line indicating relationship between deviation amount of edge of wafer pattern from edge of reference pattern and space width of reference pattern, and computer-readable recording medium
JP2019178949A Image generation method
JP2019174940A Pattern edge detection method
JP2019169593A Substrate transfer system
JP2019153537A Apparatus and method for measuring energy spectrum of reflected electron
JP2019149510A Wafer holding device
JP2019138748A Pattern measuring method
JP2019139864A Autofocus method of scanning electron microscope
JP2019045225A Image generation method
JP2019011972A Pattern edge detection method
JP2019012602A Method for verifying operating parameters of scanning electron microscope
JP2019008599A Image noise reduction method using forward propagation type neural network
JP2019009256A Pattern defect detection method
JP2019008928A Method for inspecting operation of sample stage
JP2019008873A Image acquisition system and image acquisition method
JP2019004115A Defect visualization method and defect detection method using design data
JP2018195708A Image generating apparatus
JP2018190851A Defect detection method of contact hole
US2018300872A1 Method And Apparatus For Integrated Circuit Pattern Inspection With Automatically Set Inspection Areas
US2018005366A1 Method of utilizing information on shape of frequency distribution of inspection result in a pattern inspection apparatus