Carl Zeiss Microscopy Ltd has a total of 20 patent applications. Its first patent ever was published in 2007. It filed its patents most often in EPO (European Patent Office), United States and China. Its main competitors in its focus markets electrical machinery and energy, measurement and computer technology are FEI CO, INTEGRATED DYNAMIC ELECTRON SOLUTIONS INC and HERMES MICROVISION INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | EPO (European Patent Office) | 9 | |
#2 | United States | 6 | |
#3 | China | 4 | |
#4 | India | 1 |
# | Industry | |
---|---|---|
#1 | Electrical machinery and energy | |
#2 | Measurement | |
#3 | Computer technology | |
#4 | Optics |
# | Technology | |
---|---|---|
#1 | Electric discharge tubes | |
#2 | Analysing materials | |
#3 | Electric digital data processing | |
#4 | Image data processing | |
#5 | Optical systems |
# | Name | Total Patents |
---|---|---|
#1 | Hill Edward | 8 |
#2 | Bean Stewart | 4 |
#3 | Moralee Richard | 3 |
#4 | Gohil Champ | 2 |
#5 | Edward Hill | 2 |
#6 | Bhattiprolu Sreenivas | 2 |
#7 | Guerra Diego | 2 |
#8 | Stewart Bean | 2 |
#9 | Gohill Champ | 1 |
#10 | Bean Stewart John | 1 |
Publication | Filing date | Title |
---|---|---|
EP3217420A1 | Method, analysis system and computer program product for semi-automated x-ray elemental analysis using a particle microscope | |
EP3176808A1 | Method for detecting charged particles and particle beam device for carrying out the method | |
US9620331B1 | Method for analyzing an object and charged particle beam device for carrying out the method | |
EP2990783A1 | Method and system for performing EDS analysis | |
EP2881972A1 | Method and data analysis system for semi-automated particle analysis using a charged particle beam | |
EP2755021A1 | Method of analyzing a sample and charged particle beam device for analyzing a sample | |
EP2442346A1 | Improvements in and relating to charged particle beam devices | |
EP2573796A1 | Particle beam system having a hollow light guide |