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HERMES MICROVISION INC

Overview
  • Total Patents
    211
  • GoodIP Patent Rank
    17,426
  • Filing trend
    ⇩ 58.0%
About

HERMES MICROVISION INC has a total of 211 patent applications. It decreased the IP activity by 58.0%. Its first patent ever was published in 2000. It filed its patents most often in United States, Taiwan and EPO (European Patent Office). Its main competitors in its focus markets electrical machinery and energy, measurement and computer technology are ZEISS CARL NTS GMBH, FIBICS INC and GATAN INC.

Patent filings per year

Chart showing HERMES MICROVISION INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chen Zhongwei 67
#2 Ren Weiming 62
#3 Liu Xuedong 48
#4 Jau Jack 45
#5 Fang Wei 30
#6 Chen Zhong-Wei 29
#7 Li Shuai 28
#8 Xiao Hong 24
#9 Wang Joe 23
#10 Wang Yi-Xiang 20

Latest patents

Publication Filing date Title
US2019164721A1 Systems and methods for charged particle beam modulation
US2018240645A1 Load lock system for charged particle beam imaging
SG11201806100PA Apparatus of plural charged-particle beams
US2017176358A1 Test device for defect inspection
KR20180097597A A plurality of charged particle beam devices
US2017025241A1 Apparatus of plural charged-particle beams
US2016336142A1 Apparatus of plural charged-particle beams
CN108292583A The device of multiple charged particle beams
US2016284505A1 Apparatus of plural charged-particle beams
US2016268096A1 Apparatus of plural charged-particle beams
US2016260579A1 Laser SDE effect compensation by adaptive tuning
US2016247660A1 Local alignment point calibration method in die inspection
US2016217968A1 Objective lens system for fast scanning large FOV
US2016163502A1 Method and compound system for inspecting and reviewing defects
US2016172150A1 Swing objective lens
US2016163500A1 Charged particle source
US2016314572A1 EBeam Inspection Method
US2016035533A1 Energy filter for charged particle beam apparatus
US2015325402A1 Method and system for inspecting and grounding an EUV mask
US10102619B1 Inspection method and system