CARL ZEISS SMT INC has a total of 20 patent applications. Its first patent ever was published in 2008. It filed its patents most often in WIPO (World Intellectual Property Organization), Taiwan and China. Its main competitors in its focus markets electrical machinery and energy, measurement and computer technology are ETEC CORP, BRUKER SCIENT LLC and TRIMPIN SARAH.
# | Country | Total Patents | |
---|---|---|---|
#1 | WIPO (World Intellectual Property Organization) | 15 | |
#2 | Taiwan | 3 | |
#3 | China | 1 | |
#4 | United States | 1 |
# | Industry | |
---|---|---|
#1 | Electrical machinery and energy | |
#2 | Measurement | |
#3 | Computer technology | |
#4 | Semiconductors | |
#5 | Optics | |
#6 | Engines, pumps and turbines | |
#7 | Surface technology and coating | |
#8 | Consumer goods |
# | Name | Total Patents |
---|---|---|
#1 | Notte Iv John A | 5 |
#2 | Ward Billy W | 5 |
#3 | Kotwal Naomi | 4 |
#4 | Gu Allen | 4 |
#5 | Broderick Wayne | 4 |
#6 | Case Thomas Anthony | 4 |
#7 | Candell Susan | 4 |
#8 | Scipioni Lawrence | 4 |
#9 | Knippelmeyer Rainer | 3 |
#10 | Riedesel Christoph | 2 |
Publication | Filing date | Title |
---|---|---|
WO2020191121A1 | Method for imaging a region of interest of a sample using a tomographic x-ray microscope, microscope, system and computer program | |
TW202035977A | Sample holder, system and method | |
TW202029380A | Method for moving a structure on a semiconductor article | |
WO2010135075A1 | Scan method | |
WO2010039339A2 | Aligning charged particle beams | |
WO2009155275A1 | Sample imaging with charged particles | |
WO2009154954A2 | Isotope ion microscope methods and systems | |
WO2009148881A2 | Electron detection systems and methods | |
WO2009114230A2 | Reducing particle implantation |