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STAR TECHN INC

Overview
  • Total Patents
    119
  • GoodIP Patent Rank
    182,104
About

STAR TECHN INC has a total of 119 patent applications. Its first patent ever was published in 1986. It filed its patents most often in Taiwan, United States and Japan. Its main competitors in its focus markets measurement, audio-visual technology and computer technology are CHUNGHWA PRECISION TEST TECH CO LTD, MPI CORP and GUNSEI KIMOTO.

Patent filings in countries

World map showing STAR TECHN INCs patent filings in countries

Patent filings per year

Chart showing STAR TECHN INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lou Choon Leong 79
#2 Wang Li Min 18
#3 Chen Ho Yeh 16
#4 Lou Choon-Leong 14
#5 Lau Yi Ming 12
#6 Hsu Mei-Shu 12
#7 Liu Yong Yu 8
#8 Chen Ho-Yeh 5
#9 Wang Li-Min 4
#10 Hsieh Hsiao Hui 3

Latest patents

Publication Filing date Title
TWI604198B Testing apparatus, holding assembly, and probe card carrier
US2015109016A1 Test probe card
TW201443452A Test assembly
TW201417200A Method for integrating testing resources and ic testing
TW201339597A Integrated circuits probe card having a thermometer apparatus for probes
TW201329456A Integrated circuits probe card having a reinforced structure of electric contact for probes
TW201316011A Switching matrix and testing system for semiconductor characteristic using the same
TW201305565A Probing apparatus for semiconductor devices
TW201305756A Calibration system of electronic devices
TW201226935A Test apparatus
US7986157B1 High speed probing apparatus for semiconductor devices and probe stage for the same
TW201212139A High speed probing apparatus for semiconductor devices and probe stage for the same
US2011063608A1 Sensing Module for Light-Emitting Devices and Testing Apparatus Using the Same
TW201145420A Probing apparatus
TW201142299A Probe card
CN102135550A Probe card
US2010118297A1 Microscope having multiple image-outputting devices and probing apparatus for integrated circuit devices using the same
TW201122494A Probe card
TW201042728A Probing apparatus with multiaxial stages for testing semiconductor devices
TW201033623A Method for configuring a combinational switching matrix and testing system for semiconductor devices using the same