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NIDEC READ CORP

Overview
  • Total Patents
    832
  • GoodIP Patent Rank
    4,129
  • Filing trend
    ⇩ 30.0%
About

NIDEC READ CORP has a total of 832 patent applications. It decreased the IP activity by 30.0%. Its first patent ever was published in 1997. It filed its patents most often in Japan, Taiwan and Republic of Korea. Its main competitors in its focus markets measurement, audio-visual technology and computer technology are AEHR TEST SYSTEMS, ATG TEST SYSTEMS GMBH and TECHNOPROBE SPA.

Patent filings per year

Chart showing NIDEC READ CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Yamashita Munehiro 201
#2 Ota Norihiro 90
#3 Yamamoto Masami 79
#4 Kato Minoru 76
#5 Numata Kiyoshi 72
#6 Fujino Makoto 50
#7 Takahashi Tadashi 36
#8 Miyatake Tadakazu 36
#9 Kasukabe Susumu 32
#10 Kusuda Tatsufumi 31

Latest patents

Publication Filing date Title
WO2021079945A1 Substrate inspection method, substrate inspection program, and substrate inspection device
WO2021039898A1 Inspection jig and inspection device
WO2020203848A1 Inspection jig and inspection device
CN111725649A Contact unit, aggregate of sockets constituting the same, and multipolar connector
WO2020195983A1 Inspection device
WO2020203155A1 Contact terminal, inspection jig, and inspection device
WO2020203153A1 Contact terminal, inspection jig, and inspection device
WO2020203154A1 Contact terminal, inspection tool, and inspection device
WO2020184361A1 Detection value correction system, coefficient calculating method, and detection value correction method
TW202032137A Test jig
WO2020202832A1 Measurement method and inspection device
JP2020161472A Contact unit, aggregate of sockets constituting the same, and multipole connector with contact unit
WO2020145073A1 Contact terminal, inspection tool, and inspection device
WO2020116236A1 Inspection device, inspection method, and inspection device program
TW202024652A Inspection instructions information generation device, board inspection system, inspection instructions information generation method, and inspection instructions information generation program
WO2020039969A1 Inspection jig, inspection device, and contact terminal
WO2020026888A1 Battery impedance measuring device
WO2020054214A1 Inspection instruction information generation device, substrate inspection system, inspection instruction information generation method, and inspection instruction information generation program
JP2020204529A Inspection device
WO2020012799A1 Inspection tool and inspection device