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CHUNGHWA PRECISION TEST TECH CO LTD

Overview
  • Total Patents
    140
  • GoodIP Patent Rank
    10,240
  • Filing trend
    ⇧ 10.0%
About

CHUNGHWA PRECISION TEST TECH CO LTD has a total of 140 patent applications. It increased the IP activity by 10.0%. Its first patent ever was published in 2015. It filed its patents most often in Taiwan and China. Its main competitors in its focus markets measurement, audio-visual technology and semiconductors are CENTALIC TECH DEV LTD, GUNSEI KIMOTO and KIMOTO GUNSEI.

Patent filings in countries

World map showing CHUNGHWA PRECISION TEST TECH CO LTDs patent filings in countries
# Country Total Patents
#1 Taiwan 120
#2 China 20

Patent filings per year

Chart showing CHUNGHWA PRECISION TEST TECH CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hsieh Kai-Chieh 34
#2 Su Wei-Jhih 27
#3 Lee Wen-Tsung 26
#4 Hsieh Chih-Peng 21
#5 Xie Kaijie 12
#6 Li Wencong 11
#7 Hsieh Kai Chieh 8
#8 Li Wen-Tsung 8
#9 Li Wen Tsung 8
#10 Shen Yu-Ta 8

Latest patents

Publication Filing date Title
TWI712802B Probe card device and neck-like probe thereof
TWI716252B Method for rotating and positioning a plurality of objects
TWI708062B Detachable high frequency testing device and vertical probe head thereof
TWI709752B Staggered-mode probe card
TWI705255B Testing device for testing chip
TWI702410B Testing device
TWI710775B Testing device for antenna in package ic
TWI698648B High frequency testing device and signal transmission module thereof
CN112240945A Improved structure of wafer probe card
TWI714172B Improved structure of wafer probe card
TW202102865A Integrated circuit with antenna in package testing apparatus
CN112198413A Antenna package integrated circuit testing device
CN111880067A Wafer test assembly and electrical connection module thereof
TWI682475B Wafer testing assembly
TWI695985B Vertical probe card and rectangular probe thereof
CN111721980A Vertical probe card and rectangular probe thereof
TW202035989A Vertical probe card and rectangular probe thereof
CN111721979A Probe card testing device and signal switching module thereof
CN111721976A Probe card device and conductive probe thereof
TWI680300B Probe card device and conductive probe thereof