| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United Kingdom | 6 | |
| #2 | Hong Kong | 4 | |
| #3 | China | 1 | |
| #4 | Taiwan | 1 | |
| #5 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Audio-visual technology |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Casings and printed circuits |
| # | Name | Total Patents |
|---|---|---|
| #1 | Kwok Sui Kit | 4 |
| #2 | Lam Wai Keung | 3 |
| #3 | Chan Tze Tsun | 3 |
| #4 | Lee Wo Hing | 2 |
| #5 | Kwok Siu Kit | 2 |
| #6 | Kit Kwok Sui | 2 |
| Publication | Filing date | Title |
|---|---|---|
| GB9804686D0 | Method and apparatus for micro-short removal | |
| GB9311718D0 | Testing Apparatus | |
| GB9304262D0 | Contact probe for testing electrical equipment | |
| GB9304266D0 | Contact probe for testing electrical equipment | |
| GB9304252D0 | Testing apparatus for printed circuit boards and the like | |
| GB9206068D0 | Testing apparatus |