|
KR20200137996A
|
|
MEMS Kelvin test socket
|
|
WO2020213899A1
|
|
Multi-layer mems spring pin
|
|
KR20200121241A
|
|
Multi-layer MEMS spring pin
|
|
KR102228318B1
|
|
Probe pin having outer spring
|
|
KR102232788B1
|
|
MEMS pin with integrated housing
|
|
KR102158027B1
|
|
A hollow test pin
|
|
KR102095353B1
|
|
Elastic auxiliary member for a test rubber socket, test rubber socket having the same, and a manufacturing method thereof
|
|
KR102192759B1
|
|
Device for SSD memory test socket having Key switch
|
|
KR102190547B1
|
|
Semiconductor device insert carrier
|
|
KR102166677B1
|
|
MEMS pogo pin and testing method using same
|
|
KR102182784B1
|
|
MEMS Kelvin spring pin, and Kelvin test socket using the same
|
|
KR102172785B1
|
|
Lance contact pin for burn-in test socket using lancing press and method of manufacturing the same
|
|
KR20200120014A
|
|
Pogo pin with extended contact tolerance using a MEMS plunger
|
|
KR20200109529A
|
|
Automatic loading-unloading gender for Solid State Drive test
|
|
KR20200109492A
|
|
Vertical gender for semiconductor test and manufacturing method thereof
|
|
KR20200098911A
|
|
Universal gender for Solid State Drive test
|
|
KR20200080837A
|
|
A device for flip-chip semiconductive magnetic sensor package and manufacturing method thereof
|
|
KR20200077857A
|
|
Wafer level package of acoustic wave filter having process margin
|
|
KR102121754B1
|
|
Device for test socket pin having single coil spring divided into upper and lower regions
|
|
KR102126752B1
|
|
device for test pin in which three plungers slide independently by a double coil spring, and the contact characteristics are improved through the rail
|
