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MPI CORP

Overview
  • Total Patents
    607
  • GoodIP Patent Rank
    3,861
  • Filing trend
    ⇩ 16.0%
About

MPI CORP has a total of 607 patent applications. It decreased the IP activity by 16.0%. Its first patent ever was published in 2006. It filed its patents most often in Taiwan, China and United States. Its main competitors in its focus markets measurement, semiconductors and audio-visual technology are MJC PROBE INC, GUNSEI KIMOTO and CHUNGHWA PRECISION TEST TECH CO LTD.

Patent filings in countries

World map showing MPI CORPs patent filings in countries

Patent filings per year

Chart showing MPI CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Ku Wei-Cheng 82
#2 Wei Hao 71
#3 Ku Wei Cheng 47
#4 Ho Chih-Hao 45
#5 Lai Jun-Liang 38
#6 Chen Tsung-Yi 37
#7 Wu Chien-Chou 29
#8 Lai Jun Liang 29
#9 Ho Chih Hao 24
#10 Kanev Stojan 23

Latest patents

Publication Filing date Title
US2021055344A1 Wafer inspection method and wafer probing system
US2021102992A1 Adjustable probe device for impedance testing for circuit board
US2021048451A1 Probe head for high frequency signal test and medium or low frequency signal test at the same time
US2021048452A1 Probe head for high frequency signal test and medium or low frequency signal test at the same time
CN112017981A Probe card and switching module
TW202026646A Probe card and space transformer thereof
TWI712800B Probe card and switch module
TWI704358B Suitable for probe modules with multiple units to be tested with inclined conductive contacts
CN111044764A Probe module with micro-electromechanical probe and manufacturing method thereof
TWI704355B Suitable for probe modules with multiple units to be tested with inclined conductive contacts
CN111141938A Probe module suitable for multiple units to be tested with inclined conductive contacts
TW202006366A Probe head having linear probe capable of preventing the probe from rotating and being dropped and facilitating needle penetration
TWI692644B Electronic component probing device
TW202018305A Suitable for probe modules with multiple units to be tested with inclined conductive contacts
CN110531125A Space convertor, probe card and its manufacturing method
TW202004189A Space transformer, probe card, and manufacturing methods thereof
TW202014710A Probe module having microelectromechanical probe and method of manufacturing the same
TWI691669B Concatenated component and cover assembly for temperature control system comprising a base with upper and lower surfaces, a protrusion protruding from the upper surface and having a top surface
TW202037837A Adjustable isolation device for temperature control system and assembling method thereof
TW202035997A Probe head and probe card