Learn more

SOULBRAIN ENG CO LTD

Overview
  • Total Patents
    37
  • GoodIP Patent Rank
    171,807
About

SOULBRAIN ENG CO LTD has a total of 37 patent applications. Its first patent ever was published in 2010. It filed its patents most often in Republic of Korea, China and United States. Its main competitors in its focus markets measurement, audio-visual technology and optics are GUNSEI KIMOTO, OKINS ELECTRONICS CO LTD and MJC PROBE INC.

Patent filings in countries

World map showing SOULBRAIN ENG CO LTDs patent filings in countries

Patent filings per year

Chart showing SOULBRAIN ENG CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Jang Dong Jun 8
#2 Cho Min Soo 5
#3 Ji Seong Yong 4
#4 Shim Moo Sup 4
#5 Yoo Ju Hyung 4
#6 Lee Sang Woo 3
#7 Chung Sang Ho 3
#8 Hwang Ji Hee 3
#9 Song Byoung Hak 3
#10 Lee Jae Hwan 3

Latest patents

Publication Filing date Title
WO2016190459A1 Display panel inspection camera
KR20160129652A Apparatus and method for manufacturing a camera module
KR20150142142A Method for removing noise of testing display equipment
KR20150134486A Vision inspection apparatus and method thereof
US2015061719A1 Vertical probe card for micro-bump probing
KR20150116112A Apparatus for each layer classifying defect for multi-layer having display panel
KR101485994B1 A Cost-effective Space Transformer For Vertical Probe Cards
KR20150075892A Vision inspection apparatus
KR20130040756A Shard board structure for probe card and manufacturing method thereof
KR20130049139A Pattern forming method for solar cell and pattern forming apparatus for solar cell
KR20130052076A Probe unit having multi-contact point structure for a image display pannel and manufacturiing method the multi-contact point
KR20130052080A Probe card and manufacturing mehtod of the smae
KR20130051841A Apparatus and method for alignment
KR20130051842A Probe, probe assembly and probe card comprising it
KR20130051843A Probe, probe assembly and probe card comprising it
KR20130047933A Probe, probe assembly and probe card comprising it
KR20130046886A Probe needle simultaneous soldering method and device using the same
KR20130042085A Bending unit and apparatus for testing electrical characteristics of an object including the same
KR20130040533A Strusture for preventong condensation of probe card
KR20130038741A Thin film resistor line manufacturing method of apparatus for inspecting electric condition, and thin film resistor line structure manufactured by the same method