| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Canada | 3 | |
| #2 | EPO (European Patent Office) | 3 | |
| #3 | France | 3 | |
| #4 | United States | 3 | |
| #5 | China | 2 | |
| #6 | Japan | 2 | |
| #7 | Singapore | 2 | |
| #8 | Australia | 1 | |
| #9 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Static stores |
| # | Name | Total Patents |
|---|---|---|
| #1 | Lejeune Philippe | 19 |
| #2 | Lieure Philips | 1 |
| Publication | Filing date | Title |
|---|---|---|
| FR2800168A1 | METHOD FOR TESTING ELECTRONIC COMPONENTS | |
| FR2796157A1 | METHOD FOR TESTING ELECTRONIC COMPONENTS | |
| FR2749396A1 | HELP TOOL FOR ELECTRONIC COMPONENT TESTING APPARATUS |