Learn more

IT & T

Overview
  • Total Patents
    49
  • GoodIP Patent Rank
    239,083
About

IT & T has a total of 49 patent applications. Its first patent ever was published in 2006. It filed its patents most often in Republic of Korea, Taiwan and United States. Its main competitors in its focus markets measurement, computer technology and semiconductors are EXICON CO LTD, LOGICVISION INC and RAJSKI JANUSZ.

Patent filings in countries

World map showing IT & Ts patent filings in countries
# Country Total Patents
#1 Republic of Korea 45
#2 Taiwan 3
#3 United States 1

Patent filings per year

Chart showing IT & Ts patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Chang Kyung Hun 37
#2 Oh Se Kyung 20
#3 Lee Eung Sang 12
#4 Jang Chul Ki 8
#5 Kim Young Sun 5
#6 Kang Man Gil 5
#7 Oh Sekyung 3
#8 Chang Kyunghun 3
#9 Kim Min Jung 2
#10 Cho Kyu Dae 2

Latest patents

Publication Filing date Title
KR101507542B1 A conversion device for dsa board of automatic test equipment
KR101386224B1 The floating device for dsa board of automatic test equipment and hi-fix board having the floating device
KR101368000B1 Apparatus for testing a memory formed by layer structure of control processor and target device using interconnection socket
KR101348423B1 Ejector device for test board of automatic test equipment
KR101348422B1 Pogo block device of automatic test equipment
KR101348424B1 The pogo block for hi-fix board of automatic test equipment and manufacturing method thereof
KR101348425B1 Device for timing calibration of automatic test equipment
KR101336345B1 A device for controlling event signal of module unit test in the semiconductor test systems
KR101315506B1 Signal topology circuit for adjust of length of trace to improve of signal integrity
KR101310404B1 Test device for implement error catch random access memory using static random access memory
KR101315505B1 Semiconductor test device for implement timing generator using field programmable gate array and adate207
KR101281823B1 Automatic test equipment having fixed type power board and exchange type core board
KR101243385B1 Testing device of semiconductor device improving the accuracy
KR101212823B1 A system for controlling test device
KR100999201B1 Dq multiply method for high speed clock mode and test system using the method
KR100974669B1 A built off self test circuit system or a pattern generating system that have look up table and a method for outputting test data for device under test using the system
KR20100104473A System for testing on die termination resistor
KR20100082153A Semiconductor device test system
KR20100081092A System and method for wafer test
US2010102843A1 Semiconductor test head apparatus using field programmable gate array