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Ejector device for test board of automatic test equipment
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Pogo block device of automatic test equipment
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Device for timing calibration of automatic test equipment
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Signal topology circuit for adjust of length of trace to improve of signal integrity
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Test device for implement error catch random access memory using static random access memory
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Semiconductor test device for implement timing generator using field programmable gate array and adate207
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Automatic test equipment having fixed type power board and exchange type core board
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Testing device of semiconductor device improving the accuracy
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A system for controlling test device
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Dq multiply method for high speed clock mode and test system using the method
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A built off self test circuit system or a pattern generating system that have look up table and a method for outputting test data for device under test using the system
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System for testing on die termination resistor
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Semiconductor device test system
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System and method for wafer test
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