| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 10 | |
| #2 | United Kingdom | 2 | |
| #3 | Australia | 1 | |
| #4 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Static stores | |
| #3 | Electric digital data processing |
| # | Name | Total Patents |
|---|---|---|
| #1 | Cooke Laurence H | 14 |
| #2 | Dervisoglu Bulent | 6 |
| #3 | Arat Vacit | 3 |
| #4 | Dervisoglu Bulent I | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US2009316506A1 | Serially decoded digital device testing | |
| US2006195746A1 | Variable clocked scan test improvements | |
| US2005154948A1 | Accelerated scan circuitry and method for reducing scan test data volume and execution time | |
| US2006041798A1 | Design techniques to increase testing efficiency | |
| US2003229834A1 | Variable clocked scan test circuitry and method | |
| US6687865B1 | On-chip service processor for test and debug of integrated circuits |