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EXICON CO LTD

Overview
  • Total Patents
    35
  • GoodIP Patent Rank
    90,607
  • Filing trend
    ⇧ 600.0%
About

EXICON CO LTD has a total of 35 patent applications. It increased the IP activity by 600.0%. Its first patent ever was published in 2006. It filed its patents most often in Republic of Korea. Its main competitors in its focus markets measurement, computer technology and electrical machinery and energy are IT & T, ADVANTEST K K and LOGICVISION INC.

Patent filings in countries

World map showing EXICON CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 35

Patent filings per year

Chart showing EXICON CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Shin Jong Kyoung 11
#2 Lee Chang Won 8
#3 Bang Du Hwan 8
#4 Lee Young Jin 5
#5 Park Sang Hyuk 5
#6 Ham Eung Jin 4
#7 Kim Jun Sung 3
#8 Heo Yeong Ki 3
#9 Jang Min Seok 3
#10 Lee Yu Jin 2

Latest patents

Publication Filing date Title
KR102130338B1 PCIe Test Apparatus
KR20200132424A SoC TEST SYSTEM
KR102179063B1 SoC test apparatus calculating signal line length
KR102152090B1 Test system for soc and test method thereof
KR20200124541A Dut test system combined with system application board and rectangular shaped probe card
KR102141806B1 SoC test apparatus
KR102106337B1 High-speed clock synchronization circuit for testing semiconductor device
KR102123637B1 Multi-channel connector
KR102130315B1 Cooling system of semiconductor device test board
KR102106341B1 Semiconductor device test board for obtain integrity power supply voltage
KR102102140B1 Test board of semiconductor device and test method of the same
KR102013643B1 Apparatus and method for high speed burn-in test
KR20190110723A Speedy burn-in test system of semiconductor memory device
KR20180084190A Apparatus and method for repairing clustered fault in irregularly placed through silicon vias
KR101794136B1 Test socket and test apparatus for testing semiconductor
KR101794134B1 Test head for semiconductor manufacturing apparatus
KR101794139B1 Clock Synchronization circuit system for testing semiconductor
KR20170014933A Real-time variable voltage control apparatus, semiconductor device test system using the same, and operating method thereof
KR20100137071A Clock generating circuit and test system
KR20100124482A Timing generating circuit and method of generating timing signal