Learn more

FROM 30 CO LTD

Overview
  • Total Patents
    59
  • GoodIP Patent Rank
    190,687
About

FROM 30 CO LTD has a total of 59 patent applications. Its first patent ever was published in 2001. It filed its patents most often in Republic of Korea, Japan and Taiwan. Its main competitors in its focus markets measurement, computer technology and audio-visual technology are SOFTLINK, EXICON CO LTD and ADVANTEST K K.

Patent filings in countries

World map showing FROM 30 CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 57
#2 Japan 1
#3 Taiwan 1

Patent filings per year

Chart showing FROM 30 CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hyun Byung Chul 9
#2 Jeon Tae Eul 9
#3 Yun Yeo Woon 7
#4 Nam Jung Hyun 4
#5 Kim Chang Hwan 4
#6 Chong Hong Jin 3
#7 Han Jong Woo 3
#8 Han Gyu Sam 3
#9 Lee Jong In 3
#10 Park Su Jeong 3

Latest patents

Publication Filing date Title
KR101525462B1 Inspecting system of handler picker for testing semiconductor package
KR101533022B1 Trnsfer device for semiconductor device test handler
KR101541861B1 Electric Inspection Apparatus for Conductive Film
KR101555330B1 Needle Assembly for Electric Inspecting PCB
KR101523749B1 Apparatus for Electric Inspecting PCB in High Temperature
KR20150114024A PCB Heating and Supplying Apparatus
KR101478790B1 Apparatus for testing Printed Circuit Board
KR20140029236A Apparatus for cleaning test jig for testing electrical condition of electronic component and apparatus for testing electronic component having the same
KR20140029187A Apparatus for detecting faulty jig pin used for tester of pcb
KR20140029185A Apparatus for testing of pcb
KR20140029186A Apparatus for testing electronic device
KR20100064016A Gender for test jig of memory
KR20100062527A Method and apparatus for testing memory device using 2 loading memories
KR20100048197A Test zig for memory unit
KR20100028876A Memory test system comprising automatic address setting function
KR20100007118A Method and apparatus for cutting e-fuse of semiconductor memory
KR20090120077A Apparatus for controlling measuring time of memory parameter
KR20090115615A Memory test system having fail judgment apparatus and method for judging fail of devices in memory test system
KR20090109700A Apparatus for synchronizing memory test board
KR20090107579A Apparatus for checking wafer burn-in system, wafer burn-in system having the same, and method for checking checking wafer burn-in system