Learn more

NIKON METROLOGY N V

Overview
  • Total Patents
    13
  • GoodIP Patent Rank
    169,497
  • Filing trend
    ⇩ 100.0%
About

NIKON METROLOGY N V has a total of 13 patent applications. It decreased the IP activity by 100.0%. Its first patent ever was published in 2006. It filed its patents most often in China, United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, electrical machinery and energy and mechanical elements are NIKON METROLOGY NV, ERIONIKUSU KK and PHYSICAL ELECTRONICS IND INC.

Patent filings in countries

World map showing NIKON METROLOGY N Vs patent filings in countries

Patent filings per year

Chart showing NIKON METROLOGY N Vs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Thielemans Hans 4
#2 Hadland Roger 3
#3 Vandenhoudt Geert 2
#4 Blanckaert Patrick 2
#5 Anthony Slotwinski 1
#6 Beechey Michael 1
#7 Slotwinski Anthony R 1
#8 Crampton Stephen James 1
#9 Fardell Gemma 1
#10 Hilton Daniel 1

Latest patents

Publication Filing date Title
US2015377606A1 Projection system
CN102150007A Compact fiber optic geometry for a counter chirp fmcw coherent laser radar
US2009000136A1 CMM Arm with enhanced manual control