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JPH03196456A
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Three-dimensional observation device for frozen sample
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JPH03192645A
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Method and device for observing specimen through scanning type electron microscope
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JPH03194840A
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Method and apparatus for observing specimen with scanning electron microscope
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JPH03159047A
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Electron beam deflector
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JPH03142301A
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Scanning tunnel microscope
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JPH0381941A
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Complex type microscopic measuring device
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JPH0362440A
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X-ray generator
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JPH02231552A
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Plasma spectroscopic analysis device
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JPH02204953A
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Electromagnetic field lens
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JPH02144837A
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Slot antenna
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JPS6473209A
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Method for measuring cross-sectional profile
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JPS63215907A
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Section measuring apparatus
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JPS63277911A
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Section measuring method
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JPS63215908A
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Section measurement
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JPS63215909A
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Section measurement
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JPS63215910A
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Section measurement
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JPS60218013A
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Method and instrument for measurement using electron beam
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JPS59127351A
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Method and apparatus for stabilization of charged particle ray
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JPS59126629A
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Method and device for processing by charged particle beam
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JPS59127352A
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Method and apparatus for stabilization of charged particl ray
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