| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 5 | |
| #2 | Japan | 3 | |
| #3 | Germany | 2 | |
| #4 | United Kingdom | 2 | |
| #5 | Netherlands | 2 | |
| #6 | EPO (European Patent Office) | 1 | |
| #7 | WIPO (World Intellectual Property Organization) | 1 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Measurement | |
| #3 | Optics |
| # | Technology | |
|---|---|---|
| #1 | Electric discharge tubes | |
| #2 | Optical systems | |
| #3 | Measuring length, angles and areas | |
| #4 | Measuring electric variables |
| # | Name | Total Patents |
|---|---|---|
| #1 | Mannion Martin D | 3 |
| #2 | Vogen Wayne V | 3 |
| #3 | Sanford Colin A | 3 |
| #4 | Lin Shih-Chao | 2 |
| #5 | Niiru Harisu Baumugaaten | 1 |
| #6 | Sanford Colin August | 1 |
| #7 | Sanford Colin S | 1 |
| #8 | Shii Chiyao Rin | 1 |
| #9 | Baumgarten Neil H | 1 |
| #10 | Rigg Philip R | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US5734164A | Charged particle apparatus having a canted column | |
| US5216235A | Opto-mechanical automatic focusing system and method | |
| US5049745A | Phase-compensating vibration cancellation system for scanning electron microscopes | |
| US4922196A | Beam-blanking apparatus for stroboscopic electron beam instruments | |
| US4948971A | Vibration cancellation system for scanning electron microscopes | |
| GB2029179A | Method and means for compensating for charge carrier beam astigmatism |