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COXEM CO LTD

Overview
  • Total Patents
    32
  • GoodIP Patent Rank
    103,143
  • Filing trend
    ⇩ 50.0%
About

COXEM CO LTD has a total of 32 patent applications. It decreased the IP activity by 50.0%. Its first patent ever was published in 2008. It filed its patents most often in Republic of Korea, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets electrical machinery and energy, measurement and semiconductors are SANYU ELECTRON CO LTD, MUKAIBATAKE KAZUO and TRIMPIN SARAH.

Patent filings per year

Chart showing COXEM CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lee Jun Hee 21
#2 Kim Yong Ju 17
#3 Lee Jun-Hee 4
#4 Kim Deuk Hyeon 4
#5 Lee Young Ro 3
#6 Ha Min Su 2
#7 Park Hyun Kook 2
#8 Kim Yong-Ju 2
#9 Chun Jung Bum 2
#10 Bang Guk Hyun 2

Latest patents

Publication Filing date Title
KR20210003705A Removable column unit for scanning electron microscope, and method for providing the same
KR20200130769A Electronic Microscopic Using AI Learning Data
KR20200113327A Scanning electron microscope having a removable column and, image acquisition methods using the same
KR102027559B1 High-resolution scanning electron microscope
KR20180130049A Scanning electron microscope system for integrated sample processing apparatus and method for sample three-dimensional image using the same
KR20180126113A High-resolution scanning electron microscope
KR20180017884A Scanning Electron Microscope Integrating Sample Preparation Apparatus
KR20170139231A Method for measuring number of particles of each size based on real time
KR101798473B1 High-resolution scanning electron microscope
KR20170012747A Deflector of a particle beam mass spectrometer
KR20170012746A Particle beam mass analyzer having a second electronic controller
KR20160148071A Particle characteristic diagnosis system having a particle sampling induction pipe module
KR20160148072A Transport stage of electron microscope
KR20150133318A Compact Electron Microscope
KR101524215B1 Electron microscope
KR101367193B1 Inspection method for horizontality and pressure of collet
JP2013175449A Electron microscope system utilizing augmented reality
KR101273921B1 Measuring system for horizontality and pressure of collet using capacitive sensor array panel
KR20130120564A Scanning electron microscope
KR101266270B1 Wafer inspection system and wager inspection method thereof