Learn more

NIKON METROLOGY NV

Overview
  • Total Patents
    99
  • GoodIP Patent Rank
    19,407
  • Filing trend
    ⇩ 16.0%
About

NIKON METROLOGY NV has a total of 99 patent applications. It decreased the IP activity by 16.0%. Its first patent ever was published in 2001. It filed its patents most often in EPO (European Patent Office), United States and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets electrical machinery and energy, measurement and mechanical elements are NIKON METROLOGY N V, ERIONIKUSU KK and NANOX IMAGING PLC.

Patent filings per year

Chart showing NIKON METROLOGY NVs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Hadland Roger 22
#2 Roger Hadland 8
#3 Nysen Raf 7
#4 Thys Frank 7
#5 Vandenhoudt Geert 6
#6 Thielemans Hans 6
#7 Smith James 5
#8 Slotwinski Anthony 5
#9 Hilton Daniel 5
#10 Rueb Kurt D 5

Latest patents

Publication Filing date Title
GB202011389D0 Target assembly, x-ray apparatus, structure measurement apparatus, structure measurement method, and method of modifying a target assembly
WO2020198253A1 Laser radar
EP3715782A1 Method for slot inspection
GB201904168D0 Method of setting a filament demand in an x-ray apparatus, controller, x-ray apparatus, control program and storage medium
CN108701575A Target assembly and x-ray emission device for x-ray emission device
EP3274656A2 Method for correcting coordinate measurement machine errors
US2017115455A1 Thermally compensated fiber interferometer assembly
CN106461384A Measurement probe unit for metrology applications
GB201417121D0 High voltage generator
GB201414395D0 X-ray apparatus
GB201414393D0 Z-ray beam collimator
EP2954286A1 Artefact for evaluating the performance of an x-ray computed tomography system
GB201321003D0 Calibration apparatus and method for computed tomography
GB201308597D0 X-ray imaging system with climate control
EP2831539A1 Improved optical scanning probe
GB201305658D0 Registration object, correction method and apparatus for computed radiographic tomography
US2014204363A1 Low drift reference for laser radar
GB201304870D0 X-ray source, high-voltage generator, electron beam gun, rotary target assembly, rotary target and rotary vacuum seal
EP2676153A1 System for measuring the position and movement of an object
US2010005673A1 Connection device for articulated arm measuring machines