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AU2002353876A1
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System and method for depth profiling and characterization of thin films
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US2003080292A1
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System and method for depth profiling
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|
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Control of surface potential of insulating specimens in surface analysis
|
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Anode assembly for generating x-rays and instrument with such anode assembly
|
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Scanning and high resolution electron spectroscopy and imaging
|
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Scanning auger microprobe with variable axial aperture
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Field termination plates for charged particle analyzers
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GB1338208A
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Double pass coaxial cylinder analyzer for charged particles
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|
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Sample fracturing apparatus
|
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Auger electron spectroscopy
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Solid state window controls
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US3735128A
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Field termination plate
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