Learn more

LASERTEC CORP

Overview
  • Total Patents
    422
  • GoodIP Patent Rank
    12,623
  • Filing trend
    ⇧ 16.0%
About

LASERTEC CORP has a total of 422 patent applications. It increased the IP activity by 16.0%. Its first patent ever was published in 1996. It filed its patents most often in Japan, United States and Republic of Korea. Its main competitors in its focus markets optics, measurement and environmental technology are KLA-ENCOR CORP, ACCENT OPTICAL TECH INC and KLA TENCOR INC.

Patent filings per year

Chart showing LASERTEC CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Kususe Haruhiko 157
#2 Takehisa Kiwamu 75
#3 Yonezawa Makoto 51
#4 Seki Hirokazu 30
#5 Kusunose Haruhiko 26
#6 Yamazaki Teruaki 23
#7 Awamura Naoki 22
#8 Sakuma Jun 21
#9 Miyai Hiromoto 19
#10 Ishikawa Takuji 18

Latest patents

Publication Filing date Title
US2021018832A1 Image pickup apparatus and focus adjustment method
JP2021009982A Light source, inspection device, euv light generation method, and inspection method
JP2021009274A Light source, inspection device, and production method and inspection method of euv light
JP2021001806A Illumination method, luminaire and inspection device
JP2021001924A Light source, inspection device, generation method of euv light and inspection method
JP2020194864A Imaging apparatus and imaging method
WO2019216303A1 Inspecting device, inspecting method, learning method, and program
JP2020184562A Luminaire and inspection apparatus
JP2020176858A Inspection device and inspection method
JP2020145057A Cross-section formation method and observation method
JP2020125941A Mask inspection device and focus adjustment method
JP2020118755A Inspection device, lighting device, and shading suppression method
JP2020113493A Creation method for lithium ion battery and creation method for all-solid battery
JP2020101472A Pattern inspection device and pattern inspection method
JP2020101743A Confocal microscope and its imaging method
JP2020094853A Mask inspection device, switching method, and mask inspection method
JP2020085839A Method and device for inspecting mask
JP2020076853A Wavelength conversion device, inspection device, and wavelength conversion method
JP2020076574A Pattern inspection device and pattern inspection method
JP2020064127A Measurement method and measurement device