| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Taiwan | 27 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Computer technology | |
| #3 | Audio-visual technology | |
| #4 | Basic communication technologies | |
| #5 | Semiconductors | |
| #6 | Optics |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Static stores | |
| #3 | Pulse technique | |
| #4 | Casings and printed circuits | |
| #5 | Electric digital data processing | |
| #6 | Image data processing | |
| #7 | Measuring light | |
| #8 | Television | |
| #9 | Semiconductor devices | |
| #10 | Nonlinear optics |
| # | Name | Total Patents |
|---|---|---|
| #1 | Kiyokawa Toshiyuki | 4 |
| #2 | Suga Kazunari | 2 |
| #3 | Sato Shinya | 1 |
| #4 | Fujimoto Akihiro | 1 |
| #5 | Yamashita Koichi | 1 |
| #6 | Akihiko Ito | 1 |
| #7 | Miura Takeo | 1 |
| #8 | Nakamura Hiroto | 1 |
| #9 | Nemoto Shin | 1 |
| #10 | Ikeda Hiroki | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TW343308B | Image processing method | |
| TW343282B | Testing device for a semiconductor device | |
| TW336213B | A semiconductor test device and a semiconductor element testing system with a plurality of semiconductor element test devices | |
| TW273012B | IC handler | |
| TW272257B | Testing part for IC conveying device |