NEXTEST SYSTEMS CORP has a total of 25 patent applications. Its first patent ever was published in 2001. It filed its patents most often in United States, Republic of Korea and Taiwan. Its main competitors in its focus markets measurement and computer technology are ABLEE INC, FROM 30 CO LTD and INOVYS CORP.
# | Country | Total Patents | |
---|---|---|---|
#1 | United States | 9 | |
#2 | Republic of Korea | 5 | |
#3 | Taiwan | 5 | |
#4 | WIPO (World Intellectual Property Organization) | 4 | |
#5 | China | 2 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Computer technology |
# | Technology | |
---|---|---|
#1 | Measuring electric variables | |
#2 | Static stores | |
#3 | Data recognition and presentation |
# | Name | Total Patents |
---|---|---|
#1 | Magliocco Paul | 8 |
#2 | Holmes John M | 6 |
#3 | Wakefield Ray | 6 |
#4 | Caradonna Michael | 5 |
#5 | St Jean James W | 4 |
#6 | Reynolds David D | 4 |
#7 | Trudeau Paul | 4 |
#8 | Ludwig Clifford V | 4 |
#9 | Ferland Michael R | 4 |
#10 | Parker Eric N | 4 |
Publication | Filing date | Title |
---|---|---|
KR20080022091A | System for testing smart cards and method for same | |
US2007024296A1 | Portable manipulator for stackable semiconductor test system | |
KR20060133601A | Method for testing and programming memory devices and system for same | |
KR20060034718A | Apparatus for planarizing a probe card and method using same | |
WO03093845A2 | Semiconductor test system having multitasking algorithmic pattern generator | |
US7385385B2 | System for testing DUT and tester for use therewith | |
US7003697B2 | Apparatus having pattern scrambler for testing a semiconductor device and method for operating same | |
US6754868B2 | Semiconductor test system having double data rate pin scrambling |