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CREDENCE SYSTEMS CORP

Overview
  • Total Patents
    431
About

CREDENCE SYSTEMS CORP has a total of 431 patent applications. Its first patent ever was published in 1987. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement, computer technology and basic communication technologies are ADVANTEST CORP, IT & T and WHETSEL LEE D.

Patent filings per year

Chart showing CREDENCE SYSTEMS CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Arkin Brian J 31
#2 Miller Charles A 29
#3 Dinteman Bryan J 27
#4 Lesmeister Gary J 23
#5 Kraus Lawrence 19
#6 Bedell Daniel J 17
#7 West Burnell G 17
#8 Currin Jeffrey D 16
#9 Kasapi Steven 15
#10 Kuglin Philip Theodore 15

Latest patents

Publication Filing date Title
US2010023294A1 Automated test system and method
WO2008122016A1 A multi-type test interface system and method
US7810005B1 Method and system for correcting timing errors in high data rate automated test equipment
US2008028345A1 Apparatus and method for integrated circuit design for circuit edit
US7615990B1 Loadboard enhancements for automated test equipment
US7761751B1 Test and diagnosis of semiconductors
US2008090403A1 Apparatus and method forming a contact to silicide and a contact to a contact
US2008036469A1 LRL vector calibration to the end of the probe needles for non-standard probe cards for ATE RF testers
US7372302B1 High speed, out-of-band differential pin driver
US2007290702A1 System and method for thermal management and gradient reduction
US2007291361A1 Lens housing with integrated thermal management
US2007179731A1 System and method for determining probing locations on IC
US7492181B1 Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range
US2007268006A1 D-optimized switching converter
US2007220380A1 Message system for logical synchronization of multiple tester chips
US2007111340A1 Method for in-line testing of semiconductor wafers
US7243039B1 System and method for determining probing locations on ic
KR20070093053A System and method for focused ion beam data analysis
US2007090850A1 Semiconductor integrated circuit tester with interchangeable tester module
US2007085610A1 Phase locked loop circuit