| # | Country | Total Patents | |
|---|---|---|---|
| #1 | WIPO (World Intellectual Property Organization) | 5 | |
| #2 | China | 3 | |
| #3 | EPO (European Patent Office) | 3 | |
| #4 | Canada | 2 | |
| #5 | United States | 2 | |
| #6 | Australia | 1 | |
| #7 | Hong Kong | 1 | |
| #8 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Semiconductors | |
| #3 | Measurement |
| # | Technology | |
|---|---|---|
| #1 | Electric discharge tubes | |
| #2 | Semiconductor devices | |
| #3 | Analysing materials | |
| #4 | Magnets and transformers |
| # | Name | Total Patents |
|---|---|---|
| #1 | Hunter Kevin | 14 |
| #2 | Sheils Wayne | 9 |
| #3 | Stresau Richard | 8 |
| #4 | Jurek Russel | 6 |
| #5 | Shanley Toby | 4 |
| #6 | Jurek Russell | 2 |
| #7 | Benari Yair | 2 |
| #8 | Dellagiacoma David | 1 |
| Publication | Filing date | Title |
|---|---|---|
| WO2020069557A1 | Improvements to electron multiplier internal regions | |
| CN112106171A | Sample analysis apparatus with improved input optics and component arrangement | |
| KR20200014804A | Improved charged particle detector | |
| US2018218891A1 | Apparatus and methods for focussing electrons |