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CARL ZEISS MULTISEM GMBH

Overview
  • Total Patents
    33
  • GoodIP Patent Rank
    47,977
About

CARL ZEISS MULTISEM GMBH has a total of 33 patent applications. Its first patent ever was published in 2015. It filed its patents most often in United States, Germany and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets electrical machinery and energy, computer technology and measurement are MORI MASAYA, ROBINSON ERNEST YEOMAN and MC SCIENCE KK.

Patent filings per year

Chart showing CARL ZEISS MULTISEM GMBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Zeidler Dirk 28
#2 Schubert Stefan 13
#3 Fritz Hans 12
#4 Thoma Arne 8
#5 Riedesel Christof 8
#6 Müller Ingo 7
#7 Jacobi Joerg 7
#8 Jacobi Jörg 3
#9 Major András G 3
#10 Mueller Ingo 3

Latest patents

Publication Filing date Title
DE102020107738B3 Particle beam system with a multipole lens sequence for the independent focusing of a large number of single particle beams, its use and associated process
DE102019008249B3 Particle beam system with a multi-beam deflection device and a beam catcher, method for operating the particle beam system and the associated computer program product
DE102019005362A1 Method for operating a multitude particle beam system with changing the numerical aperture, associated computer program product and multitude particle beam system
DE102019005364B3 System combination of a particle beam system and a light-optical system with collinear beam guidance and use of the system combination
DE102019004124A1 Particle beam system for the azimuthal deflection of individual particle beams and method for azimuth correction in a particle beam system
US2019355545A1 Charged particle beam system
DE102018133703A1 Device for generating a plurality of particle beams and multi-beam particle beam systems
DE102018007652A1 Particle beam system and method for current regulation of single particle beams
DE102018007455A1 Process for detector alignment when imaging objects using a multi-beam particle microscope, system and computer program product