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ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH

Overview
  • Total Patents
    28
  • GoodIP Patent Rank
    98,492
About

ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH has a total of 28 patent applications. Its first patent ever was published in 2000. It filed its patents most often in United States, EPO (European Patent Office) and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets electrical machinery and energy, measurement and engines, pumps and turbines are MELBIL CO LTD, EXTRANUCLEAR LAB INC and ICT INTEGRATED CIRCUIT TESTING GES FUR HALBLEITERPRUFTECHNIK MBH.

Patent filings in countries

World map showing ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBHs patent filings in countries

Patent filings per year

Chart showing ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBHs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Frosien Jürgen 10
#2 Adamec Pavel 8
#3 Lanio Stefan 8
#4 Winkler Dieter 7
#5 Cook Benjamin John 7
#6 Firnkes Matthias 4
#7 Vishnipolsky Jimmy 2
#8 Schönecker Gerald 2
#9 Breuer John 2
#10 Schmid Ralf 2

Latest patents

Publication Filing date Title
US2020258714A1 Device and method for operating a charged particle device with multiple beamlets
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US9697983B1 Thermal field emitter tip, electron beam device including a thermal field emitter tip and method for operating an electron beam device
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US9666406B1 Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam device
US2016240347A1 Signal charged particle deflection device, signal charged particle detection system, charged particle beam device and method of detection of a signal charged particle beam
US9633815B1 Emitter for an electron beam, electron beam device and method for producing and operating an electron emitter
US2016240345A1 Charged particle source arrangement for a charged particle beam device, charged particle beam device for sample inspection, and method for providing a primary charged particle beam for sample inspection in a charged particle beam
US2017148608A1 Housing device for magnetic shielding, housing arrangement for magnetic shielding, charged particle beam device, and method of manufacturing a housing device
US2017148609A1 Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole device
US9620328B1 Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of operating an electrostatic multipole device
US9620329B1 Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole device
US9589763B1 Method for detecting signal charged particles in a charged particle beam device, and charged particle beam device
US9472373B1 Beam separator device, charged particle beam device and methods of operating thereof
US2017047192A1 Charged particle beam device and method for inspecting and/or imaging a sample
US2016181057A1 High resolution charged particle beam device and method of operating the same
EP2779205A1 High throughput scan deflector and method of manufacturing thereof
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EP2672502A1 electron beam optical system comprising high brightness electron gun with moving axis condenser lens