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JPS60143552A
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Irradiation system for electron ray device
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JPS6113540A
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Electron microscope
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JPS60230343A
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Electron lens assembly and electron ray device fitted with the assembly
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JPS60193248A
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Method for irradiating electron rays in electron ray device
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JPS60107542A
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Method for shaping sample enveloped with resin
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JPS60105151A
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Sample transfer device for electron ray equipment
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JPS6097537A
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Sample device for electron-ray equipment
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JPS6054151A
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Sample-moving device for electron ray device
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JPS607047A
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Sample process unit of electron beam device
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JPS59221953A
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Objective lens of electron beam system
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JPS59221954A
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Specimen moving unit for electron beam system
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JPS59221955A
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Specimen observing method through quick cryo-stage
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JPS59221952A
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Electron beam irradiating method in electron beam system
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JPS59221951A
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Irradiation system for electron beam system
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JPS59219843A
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Irradiation system for electron beam device
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JPS59184442A
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Goniometer stage for electron ray apparatus
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JPS5981850A
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Electron lens
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JPS5978435A
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Scanning type electron beam apparatus
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JPS5931548A
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Focusing method for electron beam device
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JPS5927437A
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Image formation in electronic microscope
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