CARL ZEISS MICROSCOPY LLC innovation strategy

Patent filings in countries

#	Industry
#1	Electrical machinery and energy
#2	Engines, pumps and turbines
#3	Semiconductors
#4	Measurement
#5	Chemical engineering
#6	Consumer goods
#7	Control
#8	Micro-structure and nano-technology
#9	Mechanical elements

#	Technology
#1	Electric discharge tubes
#2	X-ray microscopes
#3	Semiconductor devices
#4	Analysing materials
#5	Magnetic or electrostatic solid separation
#6	Ice-boxes
#7	Nanostructure applications
#8	Compressed gas holders
#9	Systems controlling non-electric variables

Publication	Filing date	Title
DE102018212403A1	2018-07-25	Inspection system and inspection procedure for quality assessment of semiconductor structures
US2017294285A1	2017-03-27	Charged particle beam system
US2017032925A1	2016-05-24	Charged particle detecting device and charged particle beam system with same
TW201637062A	2015-12-21	Charged particle beam system, method of processing a sample, method of manufacturing a josephson junction and method of creating a plurality josephson junctions
JP2015018806A	2014-07-07	Charged particle beam system and method of operating the same
JP2015018805A	2014-07-07	Charged particle beam system and method of operating the same
JP2015018807A	2014-07-07	Charged-particle beam system and operational method therefor
JP2015018804A	2014-07-07	Charged-particle beam system and operational method therefor
JP2015018808A	2014-07-07	Charged particle beam system and method of operating the same
US2015008342A1	2014-06-25	Charged particle beam system and method of operating a charged particle beam system
US2014306121A1	2014-05-23	Ion sources, systems and methods
EP2483905A1	2010-09-15	Variable energy charged particle systems
EP2446459A2	2010-06-21	Charged particle detectors
EP2610888A2	2010-06-14	Cooled charged particle systems and methods
EP2441083A1	2010-05-28	Method and system for heating a tip apex of a charged particle source
EP2331946A2	2009-08-27	Ion beam stabilization
EP2301056A1	2008-06-20	Ion sources, systems and methods