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CASCADE MICROTECH INC

Overview
  • Total Patents
    504
  • GoodIP Patent Rank
    24,775
  • Filing trend
    ⇩ 73.0%
About

CASCADE MICROTECH INC has a total of 504 patent applications. It decreased the IP activity by 73.0%. Its first patent ever was published in 1984. It filed its patents most often in United States, WIPO (World Intellectual Property Organization) and EPO (European Patent Office). Its main competitors in its focus markets measurement, semiconductors and machines are MULTITEST ELEKTRONISCHE SYST, ADVANTEST AMERICA INC and KISTER JANUARY.

Patent filings per year

Chart showing CASCADE MICROTECH INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Gleason K Reed 64
#2 Dunklee John 58
#3 Tervo Paul A 50
#4 Strid Eric W 44
#5 Cowan Clarence E 42
#6 Andrews Mike 42
#7 Smith Kenneth R 41
#8 Hayden Leonard 35
#9 Martin John 31
#10 Harwood Warren K 30

Latest patents

Publication Filing date Title
US2018341399A1 Probe stations, probe systems including the probe stations, and methods for controlling the operation of probe stations
US2018284155A1 Probe systems and methods including electric contact detection
US2018149674A1 Contact engines, probe head assemblies, probe systems, and associated methods for on-wafer testing of the wireless operation of a device under test
US2018088149A1 Probe systems and methods
US2017285083A1 Probe systems, storage media, and methods for wafer-level testing over extended temperature ranges
DE102016122797A1 A test system and method for automatically maintaining alignment between a probe and a device under test during a temperature change
US2017146594A1 Probe systems and methods for automatically maintaining alignment between a probe and a device under test during a temperature change
US2017363681A1 Probe head assemblies and probe systems for testing integrated circuit devices
US2017356957A1 Systems and methods for electrically testing electromigration in an electromigration test structure
US2017330677A1 Space transformers, planarization layers for space transformers, methods of fabricating space transformers, and methods of planarizing space transformers
US9784763B1 Shielded probe systems with controlled testing environments
US2017269183A1 Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods
US2017248973A1 Probe systems and methods including active environmental control
US2017212166A1 Probe head assemblies with constrained internal motion and probe systems including the probe head assemblies
US2017205446A1 Shielded probe systems
US2017205443A1 Probes with fiducial marks, probe systems including the same, and associated methods
WO2016166564A1 Tester having a magnifying optical instrument
US2015255322A1 Wafer-handling end effectors with wafer-contacting surfaces and sealing structures
US2015241472A1 Systems and methods for on-wafer dynamic testing of electronic devices
US2014185649A1 Systems and methods for handling substrates at below dew point temperatures