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PHICOM CORP

Overview
  • Total Patents
    282
About

PHICOM CORP has a total of 282 patent applications. Its first patent ever was published in 1998. It filed its patents most often in Republic of Korea, Taiwan and China. Its main competitors in its focus markets measurement, machines and audio-visual technology are MULTITEST ELEKTRONISCHE SYST, CASCADE MICROTECH INC and ATG ELECTRONIC GMBH.

Patent filings per year

Chart showing PHICOM CORPs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lee Oug-Ki 41
#2 Lee Oug Ki 32
#3 Jo Yong-Hwi 14
#4 Kim Ki-Joon 13
#5 Lee Jung-Hoon 12
#6 Hwang Jun Tae 11
#7 Shin Dong Won 9
#8 Jo Yong Hwi 8
#9 Lee Han-Moo 8
#10 Song Byoung Hak 8

Latest patents

Publication Filing date Title
WO2009002067A1 Electric inspection apparatus
WO2009084770A1 Contact tip structure of a connecting element
WO2009075411A1 Method for arranging a plurality of connecting elements
KR100858018B1 Method for producing interconnection element
KR100858649B1 A plurality interconnection element for probing an electric component
KR100859120B1 Interconnection element for probing an electric component
KR20080021097A Micro probe structure
KR100815075B1 Connecting element
KR100814640B1 Contact tip structure coupled to a tilted beam
KR20090072169A Probe structure and method of manufacturing a probe structure
KR100814325B1 Contact tip structure of a connecting element
KR100819364B1 Method for determining initial position of a contact tip
KR100798296B1 Method for arranging a plurality of connection elements along an arch profile
KR100794496B1 Method for arranging a plurality of connection elements with extended portion
KR100794191B1 Method for arranging a plurality of connection elements according to an elastic displacement
KR100794190B1 Method for arranging a plurality of connection elements
KR100822714B1 Method for arranging a plurality of connection elements according to the adjustment of the elastic displacement difference
KR20090017385A Apparatus for inspecting electric condition
KR20090043276A Substrate module, and apparatus for inspecting electric condition having the same
KR20090040497A Method of manufacturing an apparatus for inspecting electric condition