NICTECH CO LTD has a total of 19 patent applications. Its first patent ever was published in 2007. It filed its patents most often in Republic of Korea, United States and Japan. Its main competitors in its focus markets measurement, machines and audio-visual technology are ADVANTEST AMERICA INC, MULTITEST ELEKTRONISCHE SYST and CASCADE MICROTECH INC.
# | Country | Total Patents | |
---|---|---|---|
#1 | Republic of Korea | 9 | |
#2 | United States | 4 | |
#3 | Japan | 3 | |
#4 | Taiwan | 3 |
# | Industry | |
---|---|---|
#1 | Measurement | |
#2 | Machines | |
#3 | Audio-visual technology | |
#4 | Semiconductors | |
#5 | Micro-structure and nano-technology | |
#6 | Mechanical elements | |
#7 | Furniture and games | |
#8 | Civil engineering |
# | Technology | |
---|---|---|
#1 | Measuring electric variables | |
#2 | Unspecified technologies | |
#3 | Casings and printed circuits | |
#4 | Making microstructural devices | |
#5 | Doors and windows | |
#6 | Household appliances | |
#7 | Semiconductor devices | |
#8 | Nails |
# | Name | Total Patents |
---|---|---|
#1 | Jeon Byung-Hee | 10 |
#2 | Kang Dae Cheol | 10 |
#3 | Kang Dae-Cheol | 9 |
#4 | Jeon Byung Hee | 9 |
#5 | Cho Young Ho | 2 |
#6 | Kim Sung Min | 1 |
Publication | Filing date | Title |
---|---|---|
KR101193102B1 | Position adjustment jig | |
TW200900703A | Probe, probe assembly and probe card having the same | |
KR100887708B1 | Mems probe card and method manufacturing the same | |
KR100867667B1 | Microstructure and method manufacturing the same | |
JP2008180716A | Probe, and probe card therewith | |
KR100867666B1 | Probe card | |
KR100867330B1 | Probe assembly for probe card | |
KR100844889B1 | Probe assembly for probe card | |
KR100813582B1 | Probe card | |
KR100813596B1 | Probe for probe card | |
KR100813578B1 | Support bar for probe card |