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Probes with high current carrying capability and laser machining methods
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Fine pitch guided vertical probe array having enclosed probe flexures
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Probe skates for electrical testing of convex pad topologies
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Multiple contact probes
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Probe retention arrangement
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Vertical guided layered probe
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Layered probes with core
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Knee probe having reduced thickness section for control of scrub motion
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Probe bonding method having improved control of bonding material
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Probe cards employing probes having retaining portions for potting in a potting region
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Sheet metal coil spring testing connector
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