Learn more

CAPRES AS

Overview
  • Total Patents
    93
  • GoodIP Patent Rank
    125,324
About

CAPRES AS has a total of 93 patent applications. Its first patent ever was published in 1999. It filed its patents most often in EPO (European Patent Office), China and WIPO (World Intellectual Property Organization). Its main competitors in its focus markets measurement, semiconductors and audio-visual technology are WILL TECHNOLOGY CO LTD, AEHR TEST SYSTEMS and KOYO TECHNOS KK.

Patent filings per year

Chart showing CAPRES ASs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Nielsen Peter Folmer 29
#2 Petersen Dirch Hjorth 25
#3 Hansen Ole 20
#4 Petersen Christian Leth 12
#5 Hansen Jesper Erdman 10
#6 Shiv Lior 10
#7 Petersen Peter R E 9
#8 Hansen Torben Mikael 8
#9 Baekbo Henrik 8
#10 Cagliani Alberto 8

Latest patents

Publication Filing date Title
WO2019096695A2 A probe for testing an electrical property of a test sample and an associated proximity detector
CN110383077A For testing the probe of the electrical characteristics of test sample
US2019310295A1 A position correction method and a system for position correction in relation to four probe resistance measurements
EP2871487A1 Small scale measurements of anisotropic sheet conductances
EP2677324A1 Deep-etched multipoint probe
EP2656056A1 Single-position hall effect measurements
EP2498081A1 Single-position hall effect measurements
EP2469271A1 Single-position Hall effect measurements
EP2237052A1 Automated multi-point probe manipulation
CN101821638A Method of determining an electrical property of test sample
EP2141503A1 A multi-point probe for testing electrical properties and a method of producing a multi-point probe
KR20100015473A Device including a contact detector
EP2101181A1 Device including a contact detector
EP2016433A1 Method for sheet resistance and leakage current density measurements on shallow semiconductor implants
EP1780550A1 A probe for testing electrical properties of test samples
EP1775594A1 Eliminating in-line positional errors for four-point resistance measurement
CN102305896A A method for providing alignment of a probe
EP2463668A2 A method and an apparatus for testing electrical properties
EP1686387A1 A method and an apparatus for testing electrical properties
EP1640730A1 A method for providing alignment of a probe