| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Republic of Korea | 4 | |
| #2 | United States | 4 | |
| #3 | EPO (European Patent Office) | 3 | |
| #4 | Taiwan | 3 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Machines |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Unspecified technologies |
| # | Name | Total Patents |
|---|---|---|
| #1 | Rhyu Dal-Lae | 10 |
| #2 | Rhyu Dal Lae | 4 |
| Publication | Filing date | Title |
|---|---|---|
| KR100703044B1 | Probe card for test and manufacturing method thereof | |
| KR100703043B1 | Probe substrate for test and manufacturing method thereof | |
| KR100703042B1 | Probe substrate for test and manufacturing method thereof | |
| KR100653831B1 | Probe substrate for test and manufacturing method thereof |