| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United Kingdom | 10 | |
| #2 | Australia | 6 | |
| #3 | WIPO (World Intellectual Property Organization) | 6 | |
| #4 | EPO (European Patent Office) | 1 | |
| #5 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Optics | |
| #2 | Measurement | |
| #3 | Audio-visual technology | |
| #4 | Computer technology |
| # | Technology | |
|---|---|---|
| #1 | Photomechanical semiconductor production | |
| #2 | Optical systems | |
| #3 | Analysing materials | |
| #4 | Image data processing | |
| #5 | Special information storage |
| # | Name | Total Patents |
|---|---|---|
| #1 | Hammond Michael John | 9 |
| #2 | Keens Andrew Peter | 8 |
| #3 | Smout Andrew Michael Christian | 8 |
| #4 | Smith Nigel Peter | 6 |
| #5 | Yanowitz Shimon Dov | 4 |
| #6 | Mayes Ian Christopher | 3 |
| #7 | Higgs Victor | 3 |
| #8 | Bland Nigel Stuart | 3 |
| #9 | Yoenhengchin Fredi | 1 |
| #10 | Swiny Michael | 1 |
| Publication | Filing date | Title |
|---|---|---|
| GB9723576D0 | Image enhancement of rectilinear marks | |
| GB9702388D0 | Selective interferometry | |
| GB9623194D0 | Image enhancement of rectilinear marks | |
| GB9618897D0 | Micro defects in silicon wafers | |
| GB9608178D0 | Image enhancement using interferometry | |
| GB9605433D0 | Image enhancement of rectilinear marks | |
| GB9603262D0 | Positional measurements | |
| GB9526015D0 | Image enhancement of rectilinear marks | |
| GB9525867D0 | Dual beam automatic focus system | |
| GB9518045D0 | Optical instruments |