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WISYS CO LTD

Overview
  • Total Patents
    17
  • GoodIP Patent Rank
    177,369
About

WISYS CO LTD has a total of 17 patent applications. Its first patent ever was published in 2009. It filed its patents most often in Republic of Korea. Its main competitors in its focus markets semiconductors, measurement and machine tools are SHIN ETSU HANDOTAI CO LTD, SHANGHAI ADVANCED SILICON TECHNOLOGY CO LTD and MIPOX CORP.

Patent filings in countries

World map showing WISYS CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 17

Patent filings per year

Chart showing WISYS CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Lee Jung Woo 17
#2 Kang Dong Seong 9
#3 Cho Hee Juong 9
#4 Yoo Keun Hong 3
#5 Lee Soo Jin 3
#6 Kim Jin Goo 2
#7 Park Sang Kyu 1
#8 Lee Kwang Hee 1
#9 Jin Do Hwa 1
#10 Han Jae Kuk 1

Latest patents

Publication Filing date Title
KR20170032928A Apparatus for Grinding Side Edge of Thin Glass Cover
KR20170032927A Grinding Head Using Grinding Tape
KR20170015669A Dispensing Apparatus
KR20160137815A Method for Forming Light Blocking Layer of LED Chip
KR101615533B1 Cassette Type Grinding Device Using Grinding Tape
KR20160017697A Method for Manufacturing LED Device Using Phosphor Film Attaching Method
KR20160017696A High Speed Dispensing Pump for Liquid Material
KR20150101666A Apparatus for Grinding Side Edge of Thin Plate Work
KR101456602B1 Apparatus for Manufacturing Phosphor Cover for LED Chip Using EHD Pump
KR101436456B1 Method of Manufacturing LED Device Using EHD Pump
KR20140012515A Apparatus for manufacturing led device using ehd pump
KR20140012516A Apparatus for manufacturing led device using variable ehd multi pump
KR20130124081A Sealer dispenser
KR20130016838A Apparatus for measuring device unit using the cross beam laser
KR20110123946A Method for measuring waffer thickness of white led scaning type
KR20110123944A Apparatus for measuring waffer thickness of white led scaning type
KR20100093215A System for inspecting status of sealer application and method of the same