| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Taiwan | 4 | |
| #2 | China | 3 | |
| #3 | Republic of Korea | 3 | |
| #4 | Japan | 2 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Lai Hung-Wei | 9 |
| #2 | Lee Tsung-Jun | 5 |
| #3 | Lai Hung Wei | 3 |
| #4 | Chen Yu Hong | 1 |
| #5 | Chen Ju Hung | 1 |
| #6 | Lee Tsung Jun | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TWI601960B | Probe card module | |
| TW201727249A | Test Device Using Switch Switching Connections between Single Signal Channel and Multiple Pads | |
| TWI571642B | Test device and method using single probe to test multiple pads of chip |