| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 7 | |
| #2 | China | 3 | |
| #3 | EPO (European Patent Office) | 1 | |
| #4 | Japan | 1 | |
| #5 | Republic of Korea | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors | |
| #3 | Audio-visual technology | |
| #4 | Control |
| # | Name | Total Patents |
|---|---|---|
| #1 | Lou Choon Leong | 10 |
| #2 | Chen Ho Yeh | 8 |
| #3 | Tseng Hsiao Ting | 3 |
| #4 | Choon Leong Lou | 2 |
| #5 | Ho Yeh Chen | 2 |
| #6 | Lau Yi Ming | 2 |
| #7 | Wang Li Min | 2 |
| #8 | Liu Junliang | 1 |
| #9 | Liu Yimin | 1 |
| #10 | Li Min Wang | 1 |
| Publication | Filing date | Title |
|---|---|---|
| US2021088581A1 | Probing apparatus and method of operating the same | |
| US2020225266A1 | Probing device | |
| US2020326366A1 | Method for determining a junction temperature of a device under test and method for controlling a junction temperature of a device under test | |
| US2016252548A1 | Test assembly and method of manufacturing the same | |
| US2014340105A1 | Test assembly | |
| US2014145740A1 | Testing device |