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WILL TECHNOLOGY CO LTD

Overview
  • Total Patents
    89
  • GoodIP Patent Rank
    191,521
About

WILL TECHNOLOGY CO LTD has a total of 89 patent applications. Its first patent ever was published in 2006. It filed its patents most often in Republic of Korea and United States. Its main competitors in its focus markets measurement, semiconductors and machines are AEHR TEST SYSTEMS, KOYO TECHNOS KK and STAR TECH INC.

Patent filings in countries

World map showing WILL TECHNOLOGY CO LTDs patent filings in countries
# Country Total Patents
#1 Republic of Korea 85
#2 United States 4

Patent filings per year

Chart showing WILL TECHNOLOGY CO LTDs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Han Jeong Seob 30
#2 Jeon Byoung Il 19
#3 Yu Jeong Hee 14
#4 Ju Young Hun 12
#5 Kim Hong Chan 12
#6 Ko Ki Don 11
#7 Kim Il 8
#8 Kim Jong Bok 7
#9 Kwon Hyuk Rang 5
#10 Park Hee Jin 5

Latest patents

Publication Filing date Title
KR101467382B1 Stacked Needle Structure of Cantilever Probe Card
KR101467383B1 Device For Testing Semiconductor Connecting Capacitor
KR101421048B1 Device For Testing Semiconductor On Mounted Active Element Chip
KR101467381B1 Device for Semiconductor Test
KR101421051B1 Device for Semiconductor Test
KR101384714B1 Device for semiconductor test
KR101479929B1 needle block for semiconductor test apparatus improving performance in high frequency
KR101311177B1 Probe card on mounted active element chip
KR20130072396A Space transformer for probe card and manufacturing method of space transformer for probe card
KR20110064105A Probe card
KR20110062192A A method for fabricating probe structure of probe card
KR20110062190A A method for bonding metal rod to sub pcb for probe card
KR20110057983A A method for calibrating auxiliary substrate installation depth
KR20110058005A Probe card
KR20110024338A Combining structure of probe
KR20110018193A Needle structure for probe card
KR100945545B1 Probe card and product method
KR20110014927A Probe card
KR20110014910A Fixing jig for needle
KR20110014928A Probe card