| # | Country | Total Patents | |
|---|---|---|---|
| #1 | Republic of Korea | 10 | |
| #2 | Taiwan | 1 | |
| #3 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Han Chung Soo | 4 |
| #2 | Han Moo Woong | 3 |
| #3 | Lee Jung Ho | 2 |
| #4 | Cho Jun Soo | 1 |
| #5 | Lee Hae Won | 1 |
| #6 | Han Chung-Soo | 1 |
| #7 | Han Moo-Woong | 1 |
| #8 | Jung Seung Ryeol | 1 |
| #9 | Cho Jun-Soo | 1 |
| Publication | Filing date | Title |
|---|---|---|
| KR101411982B1 | Probe Card | |
| KR101455540B1 | Probe card | |
| KR101411984B1 | Probe card | |
| KR20140000561A | Probe card | |
| KR20130009359A | Mounting device for fixing probing needle and producting method of probe card | |
| KR20130009469A | Probe card | |
| KR20120028206A | Probe card | |
| KR20100042832A | Stripper used for strip the cover of probe in probe card | |
| KR20090108278A | Probe Block in test machine | |
| KR20060023250A | Probe block of lcd inspection system |