| # | Country | Total Patents | |
|---|---|---|---|
| #1 | China | 5 | |
| #2 | Japan | 3 | |
| #3 | Republic of Korea | 3 | |
| #4 | Taiwan | 3 | |
| #5 | United States | 1 |
| # | Industry | |
|---|---|---|
| #1 | Measurement | |
| #2 | Semiconductors |
| # | Technology | |
|---|---|---|
| #1 | Measuring electric variables | |
| #2 | Semiconductor devices |
| # | Name | Total Patents |
|---|---|---|
| #1 | Lai Hung Wei | 7 |
| #2 | Lai Hung-Wei | 6 |
| #3 | Chen Ju Hung | 3 |
| #4 | Chen Yu Hong | 2 |
| #5 | Lai Hongwei | 2 |
| #6 | Lee Tsung-Jun | 2 |
| #7 | Chen Ruhong | 2 |
| #8 | Chen Ju-Hung | 1 |
| #9 | Lee Tsung Jun | 1 |
| Publication | Filing date | Title |
|---|---|---|
| TW201825906A | Probe card module | |
| TW201816400A | Probe card module | |
| TW201738572A | Probe card | |
| KR20160079643A | Testing station with upgrading function |