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CELADON SYSTEMS INC

Overview
  • Total Patents
    79
  • GoodIP Patent Rank
    51,375
  • Filing trend
    ⇧ 200.0%
About

CELADON SYSTEMS INC has a total of 79 patent applications. It increased the IP activity by 200.0%. Its first patent ever was published in 1998. It filed its patents most often in United States, Taiwan and China. Its main competitors in its focus markets measurement, semiconductors and machine tools are SYNC-TECH SYSTEM CORP, UNIMEMS CO LTD and SEDICON CO LTD.

Patent filings in countries

World map showing CELADON SYSTEMS INCs patent filings in countries

Patent filings per year

Chart showing CELADON SYSTEMS INCs patent filings per year from 1900 to 2020

Top inventors

# Name Total Patents
#1 Root Bryan J 72
#2 Funk William A 64
#3 Dunklee John L 26
#4 Funk William 3
#5 Palumbo Michael 3
#6 Bryan J Root 2
#7 William A Funk 2
#8 Schultz Adam J 2
#9 Tranquillo Garrett 2
#10 Kaiser Riley 2

Latest patents

Publication Filing date Title
TW202043779A Portable probe card assembly
TW202033966A High voltage probe card system
CN109324276A Magnet extension
WO2017117257A1 Modular rail systems, rail systems, mechanisms, and equipment for devices under test
CN107110890A Probe card with stress relief structure
US2016320428A1 Test apparatus having a probe core with a latch mechanism
WO2015095775A1 Microelectromechanical system (mems) based probe
US2014139248A1 Test apparatus having a probe core with a twist lock mechanism
CN106847723A Test system and indexing mechanism with a probe unit
WO2013006768A2 Test apparatus having a probe card and connector mechanism
US2009096472A1 Replaceable probe apparatus for probing semiconductor wafer
US2006186903A1 Apparatus and method for terminating probe apparatus of semiconductor wafer
US2006049841A1 Replaceable probe apparatus for probing semiconductor wafer
US6975128B1 Electrical, high temperature test probe with conductive driven guard
TW200405019A Shielded probe apparatus for probing semiconductor wafer
US6963207B2 Apparatus and method for terminating probe apparatus of semiconductor wafer
US6586954B2 Probe tile for probing semiconductor wafer
US6201402B1 Probe tile and platform for large area wafer probing