| # | Country | Total Patents | |
|---|---|---|---|
| #1 | United States | 11 |
| # | Industry | |
|---|---|---|
| #1 | Electrical machinery and energy | |
| #2 | Measurement | |
| #3 | Surface technology and coating | |
| #4 | Machine tools |
| # | Technology | |
|---|---|---|
| #1 | Electric discharge tubes | |
| #2 | Analysing materials | |
| #3 | Coating metallic material | |
| #4 | Soldering, welding and flame cutting |
| # | Name | Total Patents |
|---|---|---|
| #1 | Shichi Hiroyasu | 11 |
| #2 | Matsubara Shinichi | 7 |
| #3 | Ishitani Tohru | 6 |
| #4 | Tomimatsu Satoshi | 6 |
| #5 | Arai Noriaki | 4 |
| #6 | Saho Norihide | 3 |
| #7 | Umemura Kaoru | 3 |
| #8 | Kaneoka Noriyuki | 2 |
| #9 | Ohshima Takashi | 2 |
| #10 | Ishiguro Koji | 2 |
| Publication | Filing date | Title |
|---|---|---|
| US2013126731A1 | Charged Particle Microscope and Ion Microscope | |
| US2011266465A1 | Ion beam device |