Device and method for surface treatment of a substrate
GB201116720D0
Particle beam microscope and method of operating the particle microscope
DE102011080341A1
Method and particle beam apparatus for generating an image of an object
DE102011077635A1
High voltage power supply unit for a particle beam device
DE102011076893A1
Method and particle beam device for focusing a particle beam
DE102011018460A1
processing system
DE102011006588A1
Particle beam device with detector arrangement
NL2006308A
Transmission electron microscope.
DE102010056337A1
Particle beam system for recording of energy loss spectrum, has high voltage source for providing high voltage between two high voltage outputs and control signal
DE102010053194A1
Particle beam device with deflection system
DE102010041813A1
Particle beam apparatus and method for examining and / or processing an object
DE102010041678A1
Particle beam device with a sample carrier
EP2413345A1
Charged particle beam system
DE102010024625A1
Method for editing an object
DE102010011898A1
inspection system
DE102010002617A1
High-voltage direct current generator for e.g. transmission electron microscope, has amplifier connected with capacitive power splitter for receiving detected variations of smoothed high voltage, and voltage supply connected with amplifier
DE102010008296A1
Laser processing system, object holder and laser processing method
DE102010007777A1
particle beam
DE102010001347A1
Device for the transmission of energy and / or for the transport of an ion and particle beam device with such a device
DE102009055271A1
Method for generating a representation of an object by means of a particle beam and particle beam apparatus for carrying out the method
